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Synthesis and studies of sputter deposited ZnO films

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Author Affiliations

  • 1Gujarat Forensic Science University, Sector-9, Gadhinagar-382007, Gujarat, India
  • 2McMaster Manufacturing Research Institute, Mech. Eng. Dept., McMaster University, Main Street West, Hamilton, Ontario, L8S 4L7, Canada

Res. J. Material Sci., Volume 5, Issue (2), Pages 13-16, February,16 (2017)

Abstract

This paper is aimed to synthesize reactive sputtered ZnO coatings at altered RF powers of 50W, 75W, 100W and 125W and study it’s, optical structural and wettability properties. For characterization of ZnO coatings, X-ray Diffractometer (XRD) technique was used. XRD graphs indicate evolution of (002) peak and (100) peak for ZnO thin films with an increment of RF power from 50W to 125W. ZnO thin films become well crystalline with rising the RF power and preferred orientation of ZnO along (002) texture is observed. Surface energy and contact angle of ZnO films were determined by contact angle goniometer. UV-Vis-NIR spectrophotometer was utilized to differentiate optical properties of zinc oxide films.

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